Description
Advanced Analysis: Consolidate and Automate Design Evaluations
The LucidShape CAA Advanced Analysis tool consolidates many analysis steps into a single, automated process that can be done at any point in an optical design project. Advanced Analysis includes new interactive features that further reduce analysis time while giving you all the data you need to confirm that your designs meet performance and regulatory requirements:
- Drag-and-drop window arrangements to customize analysis views.
- Interactive exploration with crosshair points on multiple plots to give insights into which part of a light distribution needs to be changed.
- Slice plot overlays in one graph for easy data comparisons.
- The ability to add color analysis to existing and new measurements, including many regulation-standard measurements. These measurements are integrated with the measurement data grid, allowing for the validation of regulations for intensity and color in one table. The color analysis supports several color spaces as well as engineering staples such as the Planckian Locus, Helmholtz coordinates, and MacAdam ellipses.
Ray History Sensor: Rapidly Explore Light Distributions and Ray Paths
An important aspect of design troubleshooting is to identify ray paths or photometry for optical surfaces that contribute to unwanted effects on lighting system performance. This is a time- and computation-intensive process that the LucidShape CAA Ray History Sensor can substantially reduce.
The LucidShape CAA Ray History Sensor allows you to quickly correlate regions in a luminance image with specific ray paths and optical surfaces. Combined with the Dynamic Surface Result Filter, you can use the Restore from Sensor tool to explore partial light distributions or ray paths for selected surfaces without needing to run an additional simulation.
This version of LucidShape CAA expands the Ray History and Dynamic Surface Result Filter capability to most of the other sensors available in the software, including the Planar Lux Sensor, the Surface Sensor, and the License Plate Sensor.
These extensions significantly expand your options for detailed analyses (ray path and light distribution) for most sensors, allowing you to not only analyze the total result on the sensor, but also to investigate partial light distributions for a given region, actor surface, light source, or Luminance Camera.
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